RISCV_picorv32_fpga/rtl/DE0-NANO/tests/lb.S

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# See LICENSE for license details.
#*****************************************************************************
# lb.S
#-----------------------------------------------------------------------------
#
# Test lb instruction.
#
#include "riscv_test.h"
#include "test_macros.h"
RVTEST_RV32U
RVTEST_CODE_BEGIN
#-------------------------------------------------------------
# Basic tests
#-------------------------------------------------------------
TEST_LD_OP( 2, lb, 0xffffffff, 0, tdat );
TEST_LD_OP( 3, lb, 0x00000000, 1, tdat );
TEST_LD_OP( 4, lb, 0xfffffff0, 2, tdat );
TEST_LD_OP( 5, lb, 0x0000000f, 3, tdat );
# Test with negative offset
TEST_LD_OP( 6, lb, 0xffffffff, -3, tdat4 );
TEST_LD_OP( 7, lb, 0x00000000, -2, tdat4 );
TEST_LD_OP( 8, lb, 0xfffffff0, -1, tdat4 );
TEST_LD_OP( 9, lb, 0x0000000f, 0, tdat4 );
# Test with a negative base
TEST_CASE( 10, x3, 0xffffffff, \
la x1, tdat; \
addi x1, x1, -32; \
lb x3, 32(x1); \
)
# Test with unaligned base
TEST_CASE( 11, x3, 0x00000000, \
la x1, tdat; \
addi x1, x1, -6; \
lb x3, 7(x1); \
)
#-------------------------------------------------------------
# Bypassing tests
#-------------------------------------------------------------
TEST_LD_DEST_BYPASS( 12, 0, lb, 0xfffffff0, 1, tdat2 );
TEST_LD_DEST_BYPASS( 13, 1, lb, 0x0000000f, 1, tdat3 );
TEST_LD_DEST_BYPASS( 14, 2, lb, 0x00000000, 1, tdat1 );
TEST_LD_SRC1_BYPASS( 15, 0, lb, 0xfffffff0, 1, tdat2 );
TEST_LD_SRC1_BYPASS( 16, 1, lb, 0x0000000f, 1, tdat3 );
TEST_LD_SRC1_BYPASS( 17, 2, lb, 0x00000000, 1, tdat1 );
#-------------------------------------------------------------
# Test write-after-write hazard
#-------------------------------------------------------------
TEST_CASE( 18, x2, 2, \
la x3, tdat; \
lb x2, 0(x3); \
li x2, 2; \
)
TEST_CASE( 19, x2, 2, \
la x3, tdat; \
lb x2, 0(x3); \
nop; \
li x2, 2; \
)
TEST_PASSFAIL
RVTEST_CODE_END
.data
RVTEST_DATA_BEGIN
TEST_DATA
tdat:
tdat1: .byte 0xff
tdat2: .byte 0x00
tdat3: .byte 0xf0
tdat4: .byte 0x0f
RVTEST_DATA_END